Course for international guest/part time students

Faculty

Faculty of Science

Organization

TTK Department of Physical Chemistry

Code

xpsk22em

Title

The XPS Technique and its Application

Usual semester

Spring

Published semester

2025/26/2

ECTS

3

Language

en

Learning outcomes

a) Knowledge - Knows the basic concepts, correlations, laws of X-ray photoelectron spectroscopy and the basic measurement methods based on them. - Knows and applies the devices and methods of X-ray photoelectron spectroscopy and the relevant safety rules. Able to become skilled at using a specific apparatus. - Has the necessary knowledge, which allows designing of measurement and the computerized processing of measurement results. b) Abilities - Is able to apply X-ray photoelectron spectroscopy in practice. - Ability to evaluate, interpret and document the measurement results. - Able to organize the work. c) Attitude - In the laboratory works environmentally friendly. - Collaborates with his colleagues and engages in professional discussions. d) Autonomy and responsibility - Able to think through basic professional questions independently, and to make meaningful compilations.

Course content

The importance of surface modification and surface analysis. Theoretical basics of X-ray photoelectron spectroscopy (photoeffect, surfaces sensitivity, chemical shift). Short history of XPS. Instrumentation, computer systems. Basics of ultra-high vacuum technique. Interpretation of photoelectron spectra: qualitative and quantitative analysis, determination of chemical states, calculation of thickness of layered structures. Application of special techniques: hard XPS, ion etching, angle resolved experiments, near ambient pressure spectroscopy, imaging. Applications of XPS in the research and industry.

Assessment method

Assignments during the semester (Gy5)

Bibliography

Handouts can be found on the webpage of the course. D. Briggs, M. P. Seah (Eds.): Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, John Wiley & Sons, Chichester (1983). D. Briggs, M. P. Seah (Eds.): Practical Surface Analysis, 2nd ed., Vol. 1, John Wiley & Sons, Chichester, Salle+Sauerländer, Aarau, Frankfurt am Main (1990). T. L. Barr: Modern ESCA,CRC Press, Inc., Boca Raton (1994). J. C. Rivière, S. Myhra (Eds.): Handbook of Surface and Interface Analysis, Marcel Dekker, Inc., New York-Basel-Hong Kong (1998). D. Briggs, John T. Grant (eds.): Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy,  IM Publications, Chichester, SurfaceSpectra Limited, Manchester (2003). J. F. Watts, J. Wolstenholme: An Introduction to Surface Analysis by XPS and AES, John Wiley & Sons Ltd (2003).

Programmes of the course